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Language: en
Pages: 544

5th TC7 Symposium on Intelligent Measurement

Authors: Tamás Kemény

Categories: Mathematics

Type: BOOK - Published: 1988 - Publisher:

These papers deal with the impact of microelectronics, precision mechanics and optoelectronics on intelligent measurements. Main fields of application are labor

Language: en
Pages: 418

1st Conference of the Technical Committee (TC15) on Measurement of Static and Dynamic Parameters of Structures and Materials, Plzen, Czechoslovakia, May 26-28, 1987

Authors: International Measurement Confederation. Technical Committee TC15. Conference

Categories: Science

Type: BOOK - Published: 1988 - Publisher: Nova Publishers

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Contents: F Transmission Photoelasticity. Integrated Photoelasticity of the General Three-Dimensional Stress State; F Investigation of Three-Dimensional Axis-Sy

Language: en
Pages: 220

Metrological Assurance for Environmental Control

Authors: K. Havrilla

Categories: Technology & Engineering

Type: BOOK - Published: 1989 - Publisher: Nova Publishers

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Language: en
Pages: 370

2nd Symposium of the Technical Committee, Measurement of Electrical Quantities--TC4 on Industrial Measurement of Electrical and Electronic Components and Equipment

Authors: International Measurement Confederation. Technical Committee on Measurement of Electrical Quantities. Symposium

Categories: Mathematics

Type: BOOK - Published: 1988 - Publisher:

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Proceedings of the 2nd Symposum of the Technical Committee Measurement of Electrical Quantities -- TC4 on Industrial Measurement of Electrical & Electronic Comp

Language: en
Pages: 312

Proceedings of the 3rd Symposium on Measurement in Electrical and Electronic Power Systems

Authors:

Categories: Electric measurements

Type: BOOK - Published: 1989 - Publisher:

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