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Defect-Oriented Testing For Nano-Metric Cmos Vlsi Circuits, 2Nd Ed
Language: en
Pages: 349

Defect-Oriented Testing For Nano-Metric Cmos Vlsi Circuits, 2Nd Ed

Authors: Sachdev
Categories:
Type: BOOK - Published: 2009-10-01 - Publisher:

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Language: en
Pages: 343

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Authors: Manoj Sachdev
Categories: Technology & Engineering
Type: BOOK - Published: 2007-06-04 - Publisher: Springer Science & Business Media

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The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Y
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Language: en
Pages: 328

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Authors: Manoj Sachdev
Categories: Technology & Engineering
Type: BOOK - Published: 2008-11-01 - Publisher: Springer

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The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Y
Defect Oriented Testing for CMOS Analog and Digital Circuits
Language: en
Pages: 317

Defect Oriented Testing for CMOS Analog and Digital Circuits

Authors: Manoj Sachdev
Categories: Technology & Engineering
Type: BOOK - Published: 2013-06-29 - Publisher: Springer Science & Business Media

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Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs mor
Defect Oriented Testing for CMOS Circuits
Language: en
Pages: 173

Defect Oriented Testing for CMOS Circuits

Authors: Manoj Sachdev
Categories: Electric circuits
Type: BOOK - Published: 1996 - Publisher:

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