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Language: en
Pages: 697
Pages: 697
Type: BOOK - Published: 2003-10-24 - Publisher: John Wiley & Sons
Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applicatio
Language: en
Pages: 480
Pages: 480
Type: BOOK - Published: 1985-12 - Publisher: Wiley
The new standard in the field, presenting the latest design and testing methods for logic circuits, and the development of a BASIC-based simulation. Offers desi
Language: en
Pages: 126
Pages: 126
Type: BOOK - Published: 1986 - Publisher:
Language: en
Pages: 1022
Pages: 1022
Type: BOOK - Published: 2003-05-08 - Publisher: Cambridge University Press
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wi
Language: en
Pages: 55
Pages: 55
Type: BOOK - Published: 1991 - Publisher: