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Physical & Failure Analysis of Integrated Circuits, International Symposium on
Language: en
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Failure Analysis of Integrated Circuits
Language: en
Pages: 256
Authors: Lawrence C. Wagner
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

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This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and technique
24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2017)
Language: en
Pages:
Authors:
Categories: Integrated circuits
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26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2019)
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2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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Authors: IEEE Staff
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Type: BOOK - Published: 2016-07-18 - Publisher:

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IPFA is devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliabil