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Language: en
Pages: 1016
Pages: 1016
Type: BOOK - Published: 2003-05-08 - Publisher: Cambridge University Press
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wi
Language: en
Pages: 672
Pages: 672
Type: BOOK - Published: 1994-09-27 - Publisher: Wiley-IEEE Press
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the
Language: en
Pages: 452
Pages: 452
Type: BOOK - Published: 2010-12-10 - Publisher: Springer Science & Business Media
This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and me
Language: en
Pages: 1022
Pages: 1022
Type: BOOK - Published: 2003-05-08 - Publisher: Cambridge University Press
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wi
Language: en
Pages: 690
Pages: 690
Type: BOOK - Published: 2006-04-11 - Publisher: Springer Science & Business Media
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there