Anomalous X-Ray Scattering for Materials Characterization

Anomalous X-Ray Scattering for Materials Characterization
Author :
Publisher : Springer
Total Pages : 224
Release :
ISBN-10 : 9783540460084
ISBN-13 : 354046008X
Rating : 4/5 (08X Downloads)

Book Synopsis Anomalous X-Ray Scattering for Materials Characterization by : Yoshio Waseda

Download or read book Anomalous X-Ray Scattering for Materials Characterization written by Yoshio Waseda and published by Springer. This book was released on 2003-07-01 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, although the origin of such peculiar features is not fully understood. Information on the surface structure or the number density of atoms in the near surface region may provide better insight. Amorphous alloys, frequently referred to as metallic glasses, are produced by rapid quenching from the melt. The second generation amorphous alloys, called "bulk amorphous alloys", have been discovered in some Pd based and Zr based alloy systems, with a super cooled liquid region at more than 120 K. In these alloy systems, one can obtain a sample thickness of several centime ters. Growing scientific and technological curiosity about the new amorphous alloys has focused on the fundamental factors, such as the atomic scale struc ture, which are responsible for the thermal stability with certain chemical compositions.

Anomalous X-Ray Scattering for Materials Characterization Related Books

Anomalous X-Ray Scattering for Materials Characterization
Language: en
Pages: 224
Authors: Yoshio Waseda
Categories: Technology & Engineering
Type: BOOK - Published: 2003-07-01 - Publisher: Springer

GET EBOOK

The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi
X-Ray Absorption and X-Ray Emission Spectroscopy
Language: en
Pages: 896
Authors: Jeroen A. van Bokhoven
Categories: Science
Type: BOOK - Published: 2016-01-08 - Publisher: John Wiley & Sons

GET EBOOK

During the last two decades, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x–ray absorption and em
Non-Destructive Material Characterization Methods
Language: en
Pages: 842
Authors: Akira Otsuki
Categories: Science
Type: BOOK - Published: 2023-09-01 - Publisher: Elsevier

GET EBOOK

Non-Destructive Material Characterization Methods provides readers with a trove of theoretical and practical insight into how to implement different non-destruc
Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons
Language: en
Pages: 430
Authors: Sunil K Sinha
Categories: Science
Type: BOOK - Published: 2021-03-23 - Publisher: World Scientific

GET EBOOK

Advanced Characterization of Nanostructured Materials — Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters wh
Polymer Micelles
Language: en
Pages: 229
Authors: Shin-ichi Yusa
Categories: Science
Type: BOOK - Published: 2018-04-20 - Publisher: MDPI

GET EBOOK

This book is a printed edition of the Special Issue "Polymer Micelles" that was published in Polymers