Design and Construction of Three Infrared Ellipsometers for Thin-Film Research

Design and Construction of Three Infrared Ellipsometers for Thin-Film Research
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Total Pages : 11
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ISBN-10 : OCLC:1251654223
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Book Synopsis Design and Construction of Three Infrared Ellipsometers for Thin-Film Research by : KG. Harding

Download or read book Design and Construction of Three Infrared Ellipsometers for Thin-Film Research written by KG. Harding and published by . This book was released on 1981 with total page 11 pages. Available in PDF, EPUB and Kindle. Book excerpt: The University of Dayton Research Institute (UDRI) has designed and is building three infrared ellipsometers in support of the Air Force high-energy laser program. One of these instruments is a conventional null type elliposmeter for operation in the 3.39 to 4.00 ?m wavelength range. Ellipsometric parameters are determined with a precision of 0.01° at any angle of incidence from 20° to 85°. Repeatability and absolute accuracy also approach 0.01° which yields optical constants accurate to 0.1 percent in some cases. All components are mounted on removable carriers for easy interchange, although operation is normally in the PCSA (Polarizer, Compensator, Sample, Analyzer) configuration.

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