Metrology and Standardization for Nanotechnology
Author | : Elisabeth Mansfield |
Publisher | : John Wiley & Sons |
Total Pages | : 630 |
Release | : 2017-01-20 |
ISBN-10 | : 9783527800056 |
ISBN-13 | : 3527800050 |
Rating | : 4/5 (050 Downloads) |
Download or read book Metrology and Standardization for Nanotechnology written by Elisabeth Mansfield and published by John Wiley & Sons. This book was released on 2017-01-20 with total page 630 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.