Parallel Testing for Pattern Sensitive Faults in Semiconductor Random Access Memory
Author | : University of Illinois at Urbana-Champaign. Coordinated Science Laboratory. Computer Systems Group |
Publisher | : |
Total Pages | : |
Release | : 1986 |
ISBN-10 | : OCLC:123323587 |
ISBN-13 | : |
Rating | : 4/5 ( Downloads) |
Book Synopsis Parallel Testing for Pattern Sensitive Faults in Semiconductor Random Access Memory by : University of Illinois at Urbana-Champaign. Coordinated Science Laboratory. Computer Systems Group
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